Improving Test Suites for Efficient Fault Localization

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by Benoit Baudry, Franck Fleurey, Yves Le Traon
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Reference:
Improving Test Suites for Efficient Fault Localization (Benoit Baudry, Franck Fleurey, Yves Le Traon), In Proc. of the Int. Conf. on Software Engineering (ICSE), 2006.
Bibtex Entry:
@inproceedings{baudry06a,
	keywords = {test, OOP, selected},
	Author = {Baudry, Benoit and Fleurey, Franck and {Le~Traon}, Yves},
	Booktitle = {Proc. of the Int. Conf. on Software Engineering (ICSE)},
	Title = {Improving Test Suites for Efficient Fault Localization},
	url = {https://hal.inria.fr/inria-00542783/PDF/baudry06a.pdf},
	X-International-Audience = {yes},
	X-Proceedings = {yes},
	X-Language = {EN},
	Year = {2006},
	x-abbrv = {ICSE},
	pages = {82--91}
	}