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Improving Test Suites for Efficient Fault Localization

by Benoit Baudry, Franck Fleurey, Yves Le Traon
Abstract:
The need for testing-for-diagnosis strategies has been identified for a long time, but the explicit link from testing to diagnosis (fault localization) is rare. Analyzing the type of information needed for efficient fault localization, we identify the attribute (called Dynamic Basic Block) that restricts the accuracy of a diagnosis algorithm. Based on this attribute, a test-for-diagnosis criterion is proposed and validated through rigorous case studies: it shows that a test suite can be improved to reach a high level of diagnosis accuracy. So, the dilemma between a reduced testing effort (with as few test cases as possible) and the diagnosis accuracy (that needs as much test cases as possible to get more information) is partly solved by selecting test cases that are dedicated to diagnosis.
Reference:
Improving Test Suites for Efficient Fault Localization (Benoit Baudry, Franck Fleurey, Yves Le Traon), In Proceedings of the International Conference on Software Engineering (ICSE), ACM, 2006.
Bibtex Entry:
@inproceedings{baudry06a,
	Abstract = {The need for testing-for-diagnosis strategies has been identified
	for a long time, but the explicit link from testing to diagnosis
	(fault localization) is rare. Analyzing the type of information needed
	for efficient fault localization, we identify the attribute (called
	Dynamic Basic Block) that restricts the accuracy of a diagnosis algorithm.
	Based on this attribute, a test-for-diagnosis criterion is proposed
	and validated through rigorous case studies: it shows that a test
	suite can be improved to reach a high level of diagnosis accuracy.
	So, the dilemma between a reduced testing effort (with as few test
	cases as possible) and the diagnosis accuracy (that needs as much
	test cases as possible to get more information) is partly solved
	by selecting test cases that are dedicated to diagnosis.},
	keywords = {test, OOP, selected},
	Author = {Baudry, Benoit and Fleurey, Franck and {Le~Traon}, Yves},
	Booktitle = {Proceedings of the International Conference on Software Engineering (ICSE)},
	Publisher = {ACM},
	Title = {Improving Test Suites for Efficient Fault Localization},
	url = {http://www.irisa.fr/triskell/publis/2006/baudry06a.pdf},
	X-International-Audience = {yes},
	X-Proceedings = {yes},
	X-Language = {EN},
	Year = {2006},
	x-abbrv = {ICSE},
	pages = {82--91}
	}