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Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines

by Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon
Abstract:
Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature interactions (T-wise). T-wise dramatically reduces the number of test products while ensuring reasonable SPL coverage. However, automatic generation of test cases satisfying T-wise using SAT solvers raises two issues. The encoding of SPLs models and T-wise criteria into a set of formulas acceptable by the solver and their satisfaction which fails when processed “all-at-once”. We propose a scalable toolset using Alloy to automatically generate test cases satisfying T-wise from SPL models. We define strategies to split T-wise combinations into solvable subsets. We design and compute metrics to evaluate strategies on AspectOPTIMA, a concrete transactional SPL.
Reference:
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines (Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon), In Proc. of the International Conference on Software Testing (ICST), IEEE, 2010.
Bibtex Entry:
@inproceedings{Perrouin010a,
	Abstract = { Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their 
  features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space 
  of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T 
  feature interactions (T-wise). T-wise dramatically reduces the number of test products while ensuring reasonable SPL 
  coverage. However, automatic generation of test cases satisfying T-wise using SAT solvers raises two issues. 
  The encoding of SPLs models and T-wise criteria into a set of formulas acceptable by the solver and their satisfaction 
  which fails when processed ``all-at-once''. We propose a scalable toolset using Alloy to automatically generate test cases 
  satisfying T-wise from SPL models. We define strategies to split T-wise combinations into solvable subsets. 
  We design and compute metrics to evaluate strategies on AspectOPTIMA, a concrete transactional SPL.
  },
	Address = {Paris, France},
	keywords = {test, SPL, selected},
	Author = {{P}errouin, {G}illes and {S}en, {S}agar and {K}lein, {J}acques and {B}audry, {B}enoit and {L}e {T}raon, {Y}ves},
	Booktitle = {Proc. of the International Conference on Software Testing (ICST)},
    pages = {459-468}
    Month = {April},
	Publisher = {IEEE},
	Title = {Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines},
	Url = {http://www.irisa.fr/triskell/publis/2010/Perrouin010a.pdf},
	X-Country = {FR},
	X-International-Audience = {yes},
	X-Language = {EN},
	X-Proceedings = {yes},
	Year = {2010},
	x-abbrv = {ICST},
}