Program
Pacific Time
Thursday 29th
4:00pm |
Opening Yervant Zorian (Synopsys), Opening remarks |
4:10pm |
Keynote 1 Sudhanva Gurumurthi (AMD) |
5:00pm |
Human Factor break |
5:15pm |
Technical Session 1 Amit Pandey (Amazon), High Speed IO Access for Test forms the foundation for Silicon Lifecycle Management Sandeep Bhatia (Google), Functional Testing for HBM and DDR Memories |
6:15pm |
End of Day 1 |
Friday 30th
8:30am |
Technical Session 2 Andrea Matteucci, Alex Burlak, Marc Hutner, Nir Server (proteanTecs), GUC’s GLink case study: Performance and reliability monitoring for heterogeneous packaging, combining deep data with machine learning algorithms Mahta Mayahinia, Mehdi Tahoori (KIT), Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan (Synopsys), An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories Firooz Massoudi, Ash Patel (Synopsys), Silicon Lifecycle Management optimizes Vmin search enabling efficient & reliable chip operation Andy Gothard, Richard Oxland (Siemens), Validation and monitoring through the silicon lifecycle: challenges, requirements and solutions |
10:10am |
Break |
10:40am |
Keynote 2 and Invited Talk Subhasish Mitra (Stanford) Puneet Gupta (UCLA), Software-Defined Memory Error Correction |
12:00pm |
Lunch |
1:00pm |
Keynote 3 Patrick Groeneveld (Cerebras Systems) |
1:50pm |
Technical Session 3 Fadi Kurdahi (UC Irvine), Trust, But Verify: Towards Self-Aware, Safe, Autonomous Self-Driving Systems Rajesh Gupta (UCSD), Building Computing Machines That Sense, Adapt, and Approximate |
2:45pm |
Human Factor break |
3:00pm |
Technical Session 4 Wes Smith (Galaxy Semiconductor), Demonstrating Data Analytics for Sensor Data Processing; An Industrial Use Case Lee Harrison (Siemens), Securing the connected and autonomous vehicle |
3:50pm |
Closing Yervant Zorian (Synopsys) and Mehdi Tahoori (KIT), Closing remarks |