Aim of the workshop

With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable and secure operation of electronics in safety- critical, enterprise servers and cloud computing domains is still a major challenge.
While traditionally design time and test time solutions were supposed to guarantee the in-field dependability and security of electronic systems, due to complex interaction of runtime effects from running workload and environment, there is a great need for a holistic approach for silicon lifecycle management, spanning from design time to in-field monitoring and adaptation.
Therefore the solutions for lifecycle management should include various sensors and monitors embedded in different levels of the design stack, access mechanisms and standards for such on-chip and in- system sensor network, as well as data analytics on the edge and in the cloud.
The SLM Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.
SLM will take place in conjunction with the IEEE International Test Conference (ITC 23); is sponsored by IEEE Philadelphia Chapter; and conceived by the IEEE Test Technology Technical Council (TTTC).