Event Program

All times are in PDT (UTC-7)

Workshop Room: Aqua 311

Day 1 - Thursday, November 7, 2024

Time Title Authors Track
16:00 - 16:10 Opening Jyotika Athavale (Synopsys), Marcello Traiola (Inria)
Plenary Keynote Session Chair: Jyotika Athavale (Synopsys)
16:10 - 17:00 On the need to rethink silicon test to reduce SDE and improve reliability Sreejit Chakravarty (Ampere Computing) Plenary Keynote
Session 1 Session Chair: Marcello Traiola (Inria)
17:00 - 17:40 Contributions to System-Level Test from 2018 to Present Harry Chen (MediaTek Inc.) Most Impactful Speeches
17:40 - 18:10 Enhanced Hotspot Detection Through Synthetic Pattern Generation and Design of Experiments Gaurav Rajavendra Reddy, Constantinos Xanthopoulos and Yiorgos Makris (UT Dallas) Most Impactful Papers
18:10 - 18:40 Understanding Vmin Failures for Improved Testing of Timing Marginalities Adit Singh (Auburn University) Most Impactful Papers
19:00 - 21:00 Welcome Reception: Sapphire Terrace

Day 2 - Friday, November 8, 2024

Time Title Authors Track
Session 2 Session Chair: Harry Chen (MediaTek Inc.)
08:50 - 09:30 What is beyond AI? Societal opportunities and electronic design automation Valeria Bertacco (University of Michigan) Most Impactful Speeches
09:30 - 10:00 Toward Functional Safety of Systolic Array-Based Deep Learning Hardware Accelerators Shamik Kundu and Kanad Basu (UT Dallas) Most Impactful Papers
10:00 - 10:30 Break: Sapphire North Foyer
Session 3 Session Chair: Karthik Pattabiraman (University of British Columbia)
10:30 - 11:10 Paradigm Shift: Structural Approaches to Analog and RF Test Sule Ozev (Arizona State University) Most Impactful Speeches
11:10 - 11:40 Piercing Logic Locking Keys through Redundancy Identification Leon Li and Alex Orailoglu (University of California San Diego) Most Impactful Papers
12:00 - 13:20 Lunch: Promenade
Session 4 Session Chair: Angeliki Kritikakou (University of Rennes)
13:20 - 14:00 Techniques for Reliability in Edge-AI Chips Maksim Jenihhin (TalTech) Most Impactful Speeches
14:00 - 14:30 A Low-cost Fault Corrector for Deep Neural Networks through Range Restriction Zitao Chen, Guanpeng Li and Karthik Pattabiraman (University of British Columbia) Most Impactful Papers
14:30 - 14:45 Break: Sapphire North Foyer
Session 5 Session Chair: Maksim Jenihhin (TalTech)
14:45 - 15:15 FLODAM: Cross-Layer Reliability Analysis Flow of Complex Hardware Circuits during Design Phase Angeliki Kritikakou (University of Rennes), Olivier Sentieys (Inria), Youri Helen (DGA), Guillaume Hubert (Onera), Patrice Deroux-Dauphin (Temento) Most Impactful Papers
15:15 - 15:45 Testing Techniques for Approximate Integrated Circuits Alberto Bosio (Ec-Lyon), Mario Barbareschi (University of Naples), Marcello Traiola (Inria), Bastien Deveautour (University of Nantes), Patrick Girard, Arnaud Virazel (LIRMM) Most Impactful Papers
15:45 - 15:55 Closing Jyotika Athavale (Synopsys), Marcello Traiola (Inria) Closing